Please use this identifier to cite or link to this item: http://www.repository.rmutt.ac.th/xmlui/handle/123456789/1417
Title: Studies on Defect Detection and Thermal Influence in SiC Substrates Using an IR Thermal Imaging Camera
Authors: Passapong Wutimakun
Kaman Chaivanich
Theerachol Mahawan
Thongkam Chumpol
Winat Intarasuwan
Chumpol Buteprongjit
Keywords: SiC
IR camera
defect
heat propagation
temperature distribution image
Issue Date: 2554
Publisher: Chulachomklao Royal Military Academy. Department of Industrial Engineering.
Series/Report no.: Journal of Engineering, RMUTT;Volume 9 Issue 2, July - December 2011
Abstract: A long-wavelength infrared thermal imaging camera was applied to visually evaluate the thermal influence of defects in SiC substrates. Defects in substrates were rapidly and effectively detected by IR camera observation, and the dependence of the temperature on the defect size could be observed precisely. IR camera was applied to show clearly the change in heat propagation in areas of defects in SiC substrates by observation of temperature distribution images in real time. Consequently, the IR camera can be considered as an effective technique for evaluating the thermal influence of defects.
URI: http://www.repository.rmutt.ac.th/dspace/handle/123456789/1417
ISSN: 1685-5280
Appears in Collections:บทความ (Article - EN)

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